SKU:3772807863
JN-1 SEM Demonstration Specimens
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USA
- USA
- CAN
- USA
- CAN
Ships within 48 hours · Estimated delivery Jul 11 - Jul 16
Description
JN-1 SEM Demonstration SpecimensThe JN 1 Scanning Electron Microscope Demonstration Standard Specimen demonstration samples on two standard 12. 7mm (1 2") pin stubs and a 25mm mounting adapter. They allow for demonstrating any SEM at lower magnifications with known specimens. The variety of demonstration samples can also be used for training purposes. They are ideal for use on table top SEMs such as the JEOL NeoScope, Hitachi TM 1000 3000 3030, Phenom and Agilent Keysight 8500 FE
Changing rotors requires no tools
Heavy-duty construction from corrosion protected steel
ID label can be placed on back
Whipple Grid
The novel sample holder allows samples from 4-10mm to be held during indenting and cleaving
clamp is ~19mm (0
Foam Dewar - High quality
Safe for freezer storage down to -100°C
the unit remains cool ensuring sample integrity
Composition:
The PELCO® Q Pin Stubs are available in 12
1mm flats for repeatable alignment
Quick Dispatch:
Your JN-1 SEM Demonstration Specimens orders ship within 1-2 business days.
Delivery Options:
- Standard: 3-7 business days
- Fast: 2-3 business days
- Express: 1-2 business days
Order Tracking:
You'll receive a tracking link by email once your JN-1 SEM Demonstration Specimens ships.
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Exchange/Return Notes
- We offer a 30-day return/exchange service after receiving.
- Final sale items are not eligible for returns or exchanges.
- To process your return/exchange, please contact us at [email protected]
- Please click here for more details>>> Return & Exchange Policy